Publications

 

Journal Publications

  1. M. K. Okorafor and G. M. Clayton. "Modeling scanning probe microscope lateral dynamics using the probe-surface interaction signal." Review of Scientific Instruments, Submitted.
  2. G. M. Clayton, S. Tien, K.K. Leang, Q. Zou, and S. Devasia. "A Review of Feedforward Control Approaches in Nanopositioning for High Speed SPM."ASME Journal of Dynamic Systems, Measurement, and Control - Special Issue on Nanosystem Dynamics and Control. 131(6), November 2009, Paper no. 061101.
  3. G. M. Clayton and S. Devasia. "Conditions for Image-Based Identification of SPM-Nanopositioner Dynamics." IEEE/ASME Transactions on Mechatronics - Special Issue on Mechatronics for MEMS and NEMS, 14(4), August 2009, pg 405-13.
  4. G. M. Clayton, S. Tien, A. J. Fleming, S. O. R. Moheimani and S. Devasia "Inverse feedforward of charge controlled piezoelectric positioners." IFAC Mechatronics - Special Section on Optimized System Performances Through Balanced Control Strategies, The 4th IFAC Symposium on Mechatronic Systems: Mechatronics 2006, 18(5-6), June 2008, pg 273-81
  5. G. M. Clayton and S. Devasia. "Iterative image-based modeling and control for higher scanning probe microscope performance." Review of Scientific Instruments, 78(8), August 2007, Paper no. 083704. Selected for publication in the Virtual Journal of Nanoscale Science & Technology, 16(11), September 2007
  6. G. M. Clayton and S. Devasia. "Image-based compensation of dynamic effects in scanning tunneling microscopes." Nanotechnology, 16(6), June 2005, pg 809-18

Conference Proceedings

  1. G. M. Clayton and B. McManus. "Two Axis Image-based Measurement and Control for Scanning Probe Microscopes.” 2011 ACC, Submitted.
  2. G. M. Clayton and R. Stein. "An Inexpensive Hands-on Introduction to DC Motors.” 2011 ASEE Annual Conference and Exhibition. Abstract Accepted.
  3. T. Wojcik, G. M. Clayton, A. Radlinska, and N. Comolli. "The Promise of Impromptu Design Exercises as a Pedagogical Tool in Engineering Design Education." 2011 ASEE Annual Conference and Exhibition. Abstract Accepted.
  4. C. O'Brien, R. Stein, G. M. Clayton, A. Wemhoff, and C. Natarag. "Development of a Support Curriculum for SeaPerch and MATE." 2011 ASEE Annual Conference and Exhibition. Abstract Submitted.
  5. G. M. Clayton, A. Radlinska, N. Comolli, and T. Wojcik. "Integrating design education across the curriculum using impromptu design projects." Fall 2010 Mid-Atlantic ASEE Conference. Villanova, PA, USA, October 15-16, 2010. G. M. Clayton CV 3/6
  6. M. Okorafor and G. M. Clayton. "Calibration-surface-derived modeling of scanning probe microscope dynamics." 2010 IFAC Symposium on Mechatronic Systems. Boston, MA, USA, September 13-15, 2010.
  7. G. M. Clayton and V. Deshmukh. "Image-based measurement of periodic SPM trajectories." 2010 American Controls Conference, ACC, Baltimore, MD, USA, June 30-July 2, 2010
  8. G. M. Clayton, J. O'Brien, K. Kroos, and A. Fleischer. "Introduction to Mechanical Engineering – A Hands on Approach." 2010 ASEE Annual Conference and Exposition, Louisville, KY, USA June 20-23, 2010.
  9. G. M. Clayton. "Introducting Engineering Design Using Impromptu Design Projects." 2010 ASEE Annual Conference and Exposition, , Louisville, KY, USA June 20-23, 2010.
  10. G. M. Clayton and S. Devasia. "Theory for image-based estimation in scanning probe microscopes." 2009 American Controls Coference, ACC, St. Louis, MO, USA, June 10-12, 2009.
  11. G. M. Clayton and S. Devasia. "Image-based trajectory estimation for scanning tunneling microscopy." 2007 ASME International Congress and Exposition, IMECE. Seattle, WA, USA. November, 11-15, 2007.
  12. G. M. Clayton, S. Tien, A. J. Fleming, S. O. R. Moheimani and S. Devasia "Hysteresis and vibration compensation in piezoelectric actuators by integrating charge control and inverse feedforward." The 4th IFAC Symposium on Mechatronic Systems. Heidelberg, Germany. September 12-14, 2006. Shortlist for best paper by a young author.
  13. C13 G. M. Clayton and S. Devasia. "Image-based control of dynamic effects in scanning tunneling microscopes." 2004 ASME International Congress and Exposition, IMECE. Anaheim, CA, USA. November 13-19, 2004.